Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Brand: Springer-Verlag New York Inc.
SKU: 9781461337294
Price: 54.26 EUR
Availability: InStock

Volume 26

Autor: Camden R. Hubbard

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer-Verlag New York Inc.

Dostupnosť: Skladom u dodávateľa v malom množstve

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At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray...

Informácie o knihe

Autor

Camden R. Hubbard

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2011

Stránok

492

EAN

9781461337294

ISBN

1461337291

Enbook ID

02180309

Vydavateľ

Springer-Verlag New York Inc.

Hmotnosť

848

Rozmery

170 x 244 x 27

Kompletný popis

At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.

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Advances in X-Ray Analysis

Volume 26

Informácie o knihe

Kompletný popis

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