Yield and Variability Optimization of Integrated Circuits

Name: Yield and Variability Optimization of Integrated Circuits
Brand: Springer
SKU: 9780792395515
Price: 99.73 EUR
Availability: InStock

Autor: Jian Cheng Zhang, M.A. Styblinski

Jazyk:

Väzba: Pevná

Vydavateľ: Springer

Dostupnosť: Skladom u dodávateľa

Odosielame za 10-13 dní

99.73 €

Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and...

Informácie o knihe

Autor

Jian Cheng Zhang, M.A. Styblinski

Jazyk

Angličtina

Väzba

Kniha - Pevná

Vydalo

1995

Stránok

234

EAN

9780792395515

ISBN

0792395514

Enbook ID

01398308

Vydavateľ

Springer

Hmotnosť

1200

Rozmery

155 x 235 x 19

Kompletný popis

Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers.

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Yield and Variability Optimization of Integrated Circuits

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