X-Ray Microscopy

Name: X-Ray Microscopy
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783662135471
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Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983

Autor: G. Schmahl, D. Rudolph

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

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X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolutio...

Informácie o knihe

Autor

G. Schmahl, D. Rudolph

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2013

Stránok

349

EAN

9783662135471

ISBN

3662135477

Enbook ID

02176325

Vydavateľ

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Hmotnosť

533

Rozmery

152 x 229 x 20

Kompletný popis

X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de velopment of optical elements for soft x-rays render x-ray microscopy feasi ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.

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X-Ray Microscopy

Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983

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