X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Name: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783540201793
Price: 149.54 EUR
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Autor: Martin Schmidbauer

Jazyk:

Väzba: Pevná

Vydavateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

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This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scatter...

Informácie o knihe

Autor

Martin Schmidbauer

Jazyk

Angličtina

Väzba

Kniha - Pevná

Vydalo

2004

Stránok

204

EAN

9783540201793

ISBN

3540201793

Enbook ID

01558645

Vydavateľ

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Hmotnosť

494

Rozmery

155 x 235 x 16

Kompletný popis

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

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