Testing Static Random Access Memories

Name: Testing Static Random Access Memories
Brand: Springer, Berlin
SKU: 9781441954305
Price: 99.78 EUR
Availability: InStock

Defects, Fault Models and Test Patterns

Autor: Said Hamdioui

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer, Berlin

Dostupnosť: Skladom u dodávateľa

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Testing Static Random Access Memories covers testing of one of the important semiconductor memories...

Informácie o knihe

Autor

Said Hamdioui

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2010

Stránok

221

EAN

9781441954305

ISBN

1441954309

Enbook ID

01423708

Vydavateľ

Springer, Berlin

Hmotnosť

379

Rozmery

160 x 240 x 13

Kompletný popis

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

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Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

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Kompletný popis

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