Kniha Surface Roughness Study by Atomic Force Microscopy Md.Abu Sayeed

Surface Roughness Study by Atomic Force Microscopy

Surface Roughness-Practical Example

Jazyk: Angličtina
Väzba: Brožovaná
Dostupnosť: U vydavateľa na objednávku
Odosielame za 17-27 dní
48.40
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Brožovaná
Vydalo
2012
Stránok
72
EAN
9783848400355
Enbook ID
07085730
Hmotnosť
118
Rozmery
152 x 229 x 4

Kompletný popis

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

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