Kniha Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs Ruijing Shen

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Jazyk: Angličtina
Väzba: Brožovaná
Dostupnosť: U vydavateľa na objednávku
Odosielame za 17-27 dní
124.74
This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Brožovaná
Vydalo
2014
Stránok
306
EAN
9781489987877
ISBN
1489987878
Enbook ID
02597387
Hmotnosť
516
Rozmery
155 x 17 x 18

Kompletný popis

This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks and analog/mixed-signal circuits. It offers an analysis of each algorithm with applications in real circuit design.

Mohlo by vás zaujímať

The Cincinnati pioneer

John Day Caldwell
28.11
136.44
13.06
56.52

Queer Anthropology

David A.B. Murray
62.81

Signing

Janet Auster
4.41

Mr. Fear Comic Strip

Wayne Jefferson
8.74

Narrative

M. Dechaumereix
13.56

Senses of Democracy

Francine Masiello
92.89
7.85

Nasty Cutter

TIM O'MARA
9.43

Katina's Pocket Posh Journal, Mum

Andrews McMeel Publishing
7.07

Dreams of Peace

Barry D. Mann
23.98

Data & Reality

William Kent
33.81

With This Ring

Amanda Quick
11.69
69.89

Visionist

Rachel Urquhart
11.00

Zákazníci, ktorí si kúpili túto knihu, kúpili tiež

Kindertranen

Ernst Von Wildenbruch
23.58
48.55
3.33
6.09
9.92
50.13