Soft Error Mechanisms, Modeling and Mitigation

Name: Soft Error Mechanisms, Modeling and Mitigation
Brand: Springer International Publishing AG
SKU: 9783319808482
Price: 54.03 EUR
Availability: InStock

Autor: SELAHATTIN SAYIL

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer International Publishing AG

Dostupnosť: Skladom u dodávateľa v malom množstve

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54.03 €

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiati...

Informácie o knihe

Autor

SELAHATTIN SAYIL

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2018

Stránok

105

EAN

9783319808482

ISBN

9783319808482

Enbook ID

19755564

Vydavateľ

Springer International Publishing AG

Hmotnosť

454

Rozmery

155 x 235 x 6

Kompletný popis

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

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Soft Error Mechanisms, Modeling and Mitigation

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