Silicon Microstrip Detectors: Basic Characterization & QA

Name: Silicon Microstrip Detectors: Basic Characterization & QA
Brand: LAP Lambert Academic Publishing
SKU: 9783659900044
Price: 43.17 EUR
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A step-wise approach to basic electrical characterization and its quality assurance procedures

Autor: Pradeep Ghosh

Jazyk:

Väzba: Brožovaná

Vydavateľ: LAP Lambert Academic Publishing

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43.17 €

The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experime...

Informácie o knihe

Autor

Pradeep Ghosh

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2016

Stránok

124

EAN

9783659900044

ISBN

3659900044

Enbook ID

14264120

Vydavateľ

LAP Lambert Academic Publishing

Hmotnosť

201

Rozmery

150 x 220 x 7

Kompletný popis

The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experiment at FAIR and responsible for the reconstruction of the trajectories and momentum of all the charged particles originating from the interaction of heavy-ion beams and fixed target. Up to 1000 charged particles are produced per interaction, at rates up to 10 MHz to enable CBM physics with rare observables. The track reconstruction has to be achieved with 95% efficiency and a momentum resolution 1%. These requirements can be fulfilled with a tracking system of 8 low-mass layers of silicon microstrip sensors located at distances between 30 cm and 100 cm downstream of the target inside the dipole magnetic field. This book describes the characterization procedures for the prototype double-sided silicon microstrip sensors produced for the Silicon Tracking System (STS), the core detector system of the Compressed Baryonic Matter (CBM) Experiment at FAIR. The idea behind this book is to realise and investigate important and significant tests and measurements which have to be performed to characterise and investigate the overall health, operation ability & its noise performance.

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Silicon Microstrip Detectors: Basic Characterization & QA

A step-wise approach to basic electrical characterization and its quality assurance procedures

Informácie o knihe

Kompletný popis

Mohlo by vás zaujímať

Zákazníci, ktorí si kúpili túto knihu, kúpili tiež