Semiconductor Memory Testing

Name: Semiconductor Memory Testing
Brand: VDM Verlag Dr. Müller
SKU: 9783639194401
Price: 48.41 EUR
Availability: InStock

Fault Models and Test Considerations for High Performance Embedded SRAM's

Autor: Anuj Gupta

Jazyk:

Väzba: Brožovaná

Vydavateľ: VDM Verlag Dr. Müller

Dostupnosť: U vydavateľa na objednávku

Odosielame za 17-27 dní

48.41 €

Stringent test quality requirements, at-speed test limitations & total cost associated with using ex...

Informácie o knihe

Autor

Anuj Gupta

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2009

Stránok

EAN

9783639194401

Enbook ID

06827526

Vydavateľ

VDM Verlag Dr. Müller

Hmotnosť

114

Rozmery

151 x 4 x 10

Kompletný popis

Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.

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Semiconductor Memory Testing

Fault Models and Test Considerations for High Performance Embedded SRAM's

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