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Kniha Scanning Probe Microscopy Adam Foster

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

Autor: Adam Foster, Werner Hofer
Jazyk: Angličtina
Väzba: Pevná
Vydavateľ: Springer-Verlag New York Inc.
Dostupnosť: 50 % šanca
Prehľadáme celý svet
164.23 €
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers,...

Informácie o knihe

Autor
Adam Foster, Werner Hofer
Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
2006
Stránok
282
EAN
9780387400907
ISBN
0387400907
Enbook ID
05247819
Vydavateľ
Springer-Verlag New York Inc.
Hmotnosť
1310
Rozmery
155 x 235 x 18

Kompletný popis

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.§

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