Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Name: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Brand: Cambridge University Press
SKU: 9780521482660
Price: 157.48 EUR
Availability: InStock

Autor: Zhong Lin Wang

Jazyk:

Väzba: Pevná

Vydavateľ: Cambridge University Press

Dostupnosť: Skladom u dodávateľa

Odosielame za 9-15 dní

157.48 €

In this book the theories, techniques and applications of reflection electron microscopy (REM), refl...

Informácie o knihe

Autor

Zhong Lin Wang

Jazyk

Angličtina

Väzba

Kniha - Pevná

Vydalo

1996

Stránok

458

EAN

9780521482660

ISBN

0521482666

Enbook ID

02032669

Vydavateľ

Cambridge University Press

Hmotnosť

1097

Rozmery

170 x 244 x 25

Kompletný popis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

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