Kniha Pattern Recognition with Support Vector Machines Seong-Whan Lee

Pattern Recognition with Support Vector Machines

First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings

Jazyk: Angličtina
Väzba: Brožovaná
Dostupnosť: Skladom u dodávateľa
Odosielame za 5-8 dní
50.07
This book constitutes the refereed proceedings of the First International Workshop on Pattern Recogn...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Brožovaná
Vydalo
2002
Stránok
428
EAN
9783540440161
ISBN
354044016X
Enbook ID
01564514
Hmotnosť
1350
Rozmery
155 x 233 x 24

Kompletný popis

This book constitutes the refereed proceedings of the First International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002, held in Niagara Falls, Canada in August 2002.The 16 revised full papers and 14 poster papers presented together with two invited contributions were carefully reviewed and selected from 57 full paper submissions. The papers presented span the whole range of topics in pattern recognition with support vector machines from computational theories to implementations and applications.

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