Kniha Nonlinear Transistor Model Parameter Extraction Techniques Matthias Rudolph

Nonlinear Transistor Model Parameter Extraction Techniques

Jazyk: Angličtina
Väzba: Pevná
Dostupnosť: 50 % šanca
Prehľadáme celý svet
154.28
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art te...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
2011
Stránok
366
EAN
9780521762106
ISBN
0521762103
Enbook ID
04385316
Hmotnosť
860
Rozmery
179 x 252 x 22

Kompletný popis

Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction.

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