Kniha Microelectronic Reliability Emiliano Pollino

Microelectronic Reliability

Jazyk: Angličtina
Väzba: Pevná
Dostupnosť: Skladom u dodávateľa
Odosielame za 9-15 dní
150.75
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
1989
Stránok
556
EAN
9780890063507
ISBN
9780890063507
Enbook ID
05357937
Hmotnosť
982
Rozmery
152 x 229 x 34

Kompletný popis

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

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