Kniha Infrared Ellipsometry on Semiconductor Layer Structures M. Schubert

Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons

Autor: M. Schubert
Jazyk: Angličtina
Väzba: Pevná
Dostupnosť: Skladom u dodávateľa v malom množstve
Odosielame za 11-15 dní
238.68
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field w...

Informácie o knihe

Autor
Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
2004
Stránok
196
EAN
9783540232490
ISBN
3540232494
Enbook ID
01559880
Hmotnosť
1060
Rozmery
155 x 232 x 17

Kompletný popis

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

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