Extended Defects in Semiconductors

Name: Extended Defects in Semiconductors
Brand: Cambridge University Press
SKU: 9781107424142
Price: 93.24 EUR
Availability: InStock

Electronic Properties, Device Effects and Structures

Autor: D. B. Holt, B. G. Yacobi

Jazyk:

Väzba: Brožovaná

Vydavateľ: Cambridge University Press

Dostupnosť: Skladom u dodávateľa

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93.24 €

The elucidation of the effects of structurally extended defects on electronic properties of material...

Informácie o knihe

Autor

D. B. Holt, B. G. Yacobi

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2014

Stránok

644

EAN

9781107424142

ISBN

1107424143

Enbook ID

04767694

Vydavateľ

Cambridge University Press

Hmotnosť

1010

Rozmery

170 x 244 x 33

Kompletný popis

The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

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Extended Defects in Semiconductors

Electronic Properties, Device Effects and Structures

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