Experimental Techniques for Low-Temperature Measurements

Name: Experimental Techniques for Low-Temperature Measurements
Brand: Oxford University Press
SKU: 9780198570547
Price: 176.99 EUR
Availability: InStock

Cryostat Design, Material Properties and Superconductor Critical-Current Testing

Autor: Jack Ekin

Jazyk:

Väzba: Pevná

Vydavateľ: Oxford University Press

Dostupnosť: Skladom u dodávateľa

Odosielame za 10-18 dní

176.99 €

This book presents a highly integrated, step-by-step approach to the design and construction of low-...

Informácie o knihe

Autor

Jack Ekin

Jazyk

Angličtina

Väzba

Kniha - Pevná

Vydalo

2006

Stránok

704

EAN

9780198570547

ISBN

0198570546

Enbook ID

04527931

Vydavateľ

Oxford University Press

Hmotnosť

1498

Rozmery

177 x 252 x 35

Kompletný popis

This book presents a highly integrated, step-by-step approach to the design and construction of low-temperature measurement apparatus. It is effectively two books in one: A textbook on cryostat design techniques and an appendix data handbook that provides materials-property data for carrying out that design. The main text encompasses a wide range of information, written for specialists, without leaving beginning students behind. After summarizing cooling methods, Part I provides core information in an accessible style on techniques for cryostat design and fabrication - including heat-transfer design, selection of materials, construction, wiring, and thermometry, accompanied by many graphs, data, and clear examples. Part II gives a practical user's perspective of sample mounting techniques and contact technology. Part III applies the information from Parts I and II to the measurement and analysis of superconductor critical currents, including in-depth measurement techniques and the latest developments in data analysis and scaling theory.The appendix is a ready reference handbook for cryostat design, encompassing seventy tables compiled from the contributions of experts and over fifty years of literature.

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Experimental Techniques for Low-Temperature Measurements

Cryostat Design, Material Properties and Superconductor Critical-Current Testing

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Kompletný popis

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