Electron Nano-Imaging

Name: Electron Nano-Imaging
Brand: Springer Verlag, Japan
SKU: 9784431568049
Price: 100.36 EUR
Availability: InStock

Basics of Imaging and Diffraction for TEM and STEM

Autor: Nobuo Tanaka

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer Verlag, Japan

Dostupnosť: U vydavateľa na objednávku

Odosielame za 17-27 dní

100.36 €

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and sca...

Informácie o knihe

Autor

Nobuo Tanaka

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2018

Stránok

333

EAN

9784431568049

Enbook ID

20094885

Vydavateľ

Springer Verlag, Japan

Hmotnosť

618

Rozmery

155 x 16 x 19

Kompletný popis

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today's graduate students and professionals just starting their careers.

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Electron Nano-Imaging

Basics of Imaging and Diffraction for TEM and STEM

Informácie o knihe

Kompletný popis

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Zákazníci, ktorí si kúpili túto knihu, kúpili tiež