Electromigration Inside Logic Cells

Name: Electromigration Inside Logic Cells
Brand: Springer International Publishing AG
SKU: 9783319840413
Price: 54.1 EUR
Availability: InStock

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Autor: GRACIELI POSSER

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer International Publishing AG

Dostupnosť: Skladom u dodávateľa v malom množstve

Odosielame za 13-18 dní

54.10 €

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-inte...

Informácie o knihe

Autor

GRACIELI POSSER

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2018

Stránok

118

EAN

9783319840413

ISBN

9783319840413

Enbook ID

19821903

Vydavateľ

Springer International Publishing AG

Hmotnosť

454

Rozmery

155 x 235 x 5

Kompletný popis

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.

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Electromigration Inside Logic Cells

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

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