Defects in Microelectronic Materials and Devices

Name: Defects in Microelectronic Materials and Devices
Brand: Taylor & Francis Ltd
SKU: 9780367386399
Price: 92.81 EUR
Availability: InStock

Autor: Daniel M. Fleetwood, Ronald D. Schrimpf

Jazyk:

Väzba: Brožovaná

Vydavateľ: Taylor & Francis Ltd

Dostupnosť: Skladom u dodávateľa

Odosielame za 14-21 dní

92.81 €

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devi...

Informácie o knihe

Autor

Daniel M. Fleetwood, Ronald D. Schrimpf

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2019

Stránok

770

EAN

9780367386399

ISBN

0367386399

Enbook ID

24253121

Vydavateľ

Taylor & Francis Ltd

Hmotnosť

1430

Rozmery

178 x 254 x 43

Kompletný popis

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be dam

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Defects in Microelectronic Materials and Devices

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