Kniha Characterization of Microstructures by Analytical Electron Microscopy (AEM) Yonghua Rong

Characterization of Microstructures by Analytical Electron Microscopy (AEM)

Autor: Yonghua Rong
Jazyk: Angličtina
Väzba: Pevná
Vydavateľ: Springer, Berlin
Dostupnosť: 50 % šanca
Prehľadáme celý svet
216.45
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic co...

Informácie o knihe

Autor
Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
2011
Stránok
500
EAN
9783642201189
Enbook ID
01657685
Vydavateľ
Hmotnosť
998
Rozmery
155 x 235 x 36

Kompletný popis

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. §The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics.§Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

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