Kniha Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Samuel H. Cohen

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Jazyk: Angličtina
Väzba: Pevná
Dostupnosť: Skladom u dodávateľa v malom množstve
Odosielame za 13-18 dní
162.31
This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposi...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
1999
Stránok
210
EAN
9780306462979
ISBN
0306462974
Enbook ID
01379186
Hmotnosť
635
Rozmery
178 x 254 x 20

Kompletný popis

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

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