AI, Machine Learning and Deep Learning
A Security Perspective
Autor:
Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA), Hei, Xiali (University of Louisiana at Lafayette, USA)
Dostupnosť:
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Odosielame za 9-15 dní
155.16
€
Today AI and Machine/Deep Learning have become the hottest areas in the information technology. This...
