Advances in Scanning Probe Microscopy

Name: Advances in Scanning Probe Microscopy
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783642630842
Price: 100.02 EUR
Availability: InStock

Autor: T. Sakurai, Y. Watanabe

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Dostupnosť: Skladom u dodávateľa

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100.02 €

There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy...

Informácie o knihe

Autor

T. Sakurai, Y. Watanabe

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2012

Stránok

343

EAN

9783642630842

ISBN

3642630847

Enbook ID

06871185

Vydavateľ

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Hmotnosť

551

Rozmery

155 x 235 x 20

Kompletný popis

There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

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Advances in Scanning Probe Microscopy

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