Kniha Advances in Imaging and Electron Physics Peter W. Hawkes

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Jazyk: Angličtina
Väzba: Pevná
Dostupnosť: U vydavateľa na objednávku
Odosielame za 28-34 dní
200.67
"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronic...

Informácie o knihe

Jazyk
Angličtina
Väzba
Kniha - Pevná
Vydalo
2010
Stránok
304
EAN
9780123813183
ISBN
0123813182
Enbook ID
04494502
Hmotnosť
540
Rozmery
152 x 229 x 20

Kompletný popis

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. It features contributions from leading international scholars and industry experts. It discusses hot topic areas and presents current and future research trends. It is an invaluable reference and guide for physicists, engineers and mathematicians.

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