Advanced Transmission Electron Microscopy

Name: Advanced Transmission Electron Microscopy
Brand: Springer-Verlag New York Inc.
SKU: 9781493982493
Price: 87.75 EUR
Availability: InStock

Imaging and Diffraction in Nanoscience

Autor: Jian Min Zuo, John C.H. Spence

Jazyk:

Väzba: Brožovaná

Vydavateľ: Springer-Verlag New York Inc.

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87.75 €

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffra...

Informácie o knihe

Autor

Jian Min Zuo, John C.H. Spence

Jazyk

Angličtina

Väzba

Kniha - Brožovaná

Vydalo

2018

Stránok

729

EAN

9781493982493

Enbook ID

20091893

Vydavateľ

Springer-Verlag New York Inc.

Hmotnosť

1262

Rozmery

236 x 156 x 34

Kompletný popis

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction . As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

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Advanced Transmission Electron Microscopy

Imaging and Diffraction in Nanoscience

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